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1

[IEEE Conference on Optoelectronic and Microelectronic Materials and Devices - COMMAD'98 - Perth, WA, Australia (14-16 Dec. 1998)] 1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140) - Determination of carrier generation lifetime via current transient in MOS capacitor

Kong, F., Lau, M., Yew-Tong Yeow,

Year:

1999

Language:

english

File:

PDF, 242 KB

english, 1999

2

Measurement of MOSFET channel potential profile

Journal:

IEEE Transactions on Electron Devices

Year:

1988

Language:

english

File:

PDF, 456 KB

english, 1988

3

Arriving at a unified model for hot-carrier degradation in MOSFET's through gate-to-drain capacitance measurement

Ghodsi, R., Yew-Tong Yeow, Chung Ho Ling, Alam, M.K.

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 809 KB

english, 1994

4

Improvement in off-State Leakage Current of n-Channel SOS MOSFETs by Hydrogen Annealing of the SOS Film

Domyo, H., Imthurn, G., Tran Ho, Miscione, A.M., Rakic, A.D., Yew-Tong Yeow

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 273 KB

english, 2011

5

Monitoring the Electrical Properties of the Back Silicon Interface of Silicon-on-Sapphire Wafers

Domyo, H., Bertling, K., Tran Ho,, Kistler, N., Imthurn, G., Stuber, M., Rakic, A.D., Yew-Tong Yeow,

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 117 KB

english, 2008

6

[IEEE 2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD) - Sydney, Australia (2008.07.28-2008.08.1)] 2008 Conference on Optoelectronic and Microelectronic Materials and Devices - Origin of the low frequency type curve in Silicon-on-Sapphire MOS capacitors

Domyo, Hiroshi, Bertling, Karl, Ho, Tran, Kistler, Neal, Imthurn, George, Stuber, Michael, Rakic, Aleksandar D., Yew-Tong Yeow,

Year:

2008

Language:

english

File:

PDF, 80 KB

english, 2008

7

Measurement of plasma etch damage by a new slow trap profiling technique

Tanner, P., Dimitrijev, S., Yew-Tong Yeow,, Harrison, H.B.

Journal:

IEEE Electron Device Letters

Year:

1996

Language:

english

File:

PDF, 370 KB

english, 1996

8

Measurement and numerical modeling of short-channel MOSFET gate capacitances

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 1.04 MB

english, 1987

9

[IEEE 2006 Conference on Optoelectronic and Microelectronic Materials and Devices - Perth, Australia (2006.12.6-2006.12.8)] 2006 Conference on Optoelectronic and Microelectronic Materials and Devices - Numerical Modelling Study of the Sensitivity of SOS MOSFET Characteristics to Silicon film Thickness and Back Surface Trapped Charge Variation

Bertling, Karl, Rakic, A. D., Yeow, Yew-Tong

Year:

2006

Language:

english

File:

PDF, 75 KB

english, 2006

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